Description: Assessing Fault Model and Test Quality, Hardcover by Butler, Kenneth M.; Mercer, Melvin Ray, ISBN 0792392221, ISBN-13 9780792392224, Like New Used, Free shipping in the US Condenses an extensive literature search on the research into the nature of logical fault models and their interactions with automatic-test-pattern-generation algorithms, which has remained fairly static compared to the advances in the integrated circuit technology it is applied to. Also introduces a methodology based on symbolic Boolean functional analysis using ordered binary decision diagrams. Annotation copyright Book News, Inc. Portland, Or.
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Restocking Fee: No
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Book Title: Assessing Fault Model and Test Quality
Number of Pages: Xix, 132 Pages
Publication Name: Assessing Fault Model and Test Quality
Language: English
Publisher: Springer
Subject: Electronics / Circuits / Integrated, Cad-Cam, Electrical
Publication Year: 1991
Type: Textbook
Item Weight: 31 Oz
Author: Kenneth M. Butler, M. Ray Mercer
Subject Area: Computers, Technology & Engineering
Item Length: 9.3 in
Series: The Springer International Series in Engineering and Computer Science Ser.
Item Width: 6.1 in
Format: Hardcover
